2N2102A
65V,1A,1W Through-Hole Transistor-Small Signal (<=1A) NPN High Current
Specifications
Base-Emitter Saturation Voltage (VBE(SAT))
1.1 V
Case Type
TO-39
Collector-Base Breakdown Voltage (BVCBO)
120 V
Collector-Base Cutoff Current (ICBO)
2000 nA
Collector-Base Cutoff Current (ICBO)
2 nA
Collector-Base Voltage
120 V
Collector-Emitter Breakdown Voltage (BVCER)
80 V
Collector-Emitter Breakdown Voltage (BVCEO)
65 V
Collector-Emitter Saturation Voltage (VCE(SAT))
300 mV
Collector-Emitter Voltage (VCEO)
65 V
Collector-Emitter Voltage (VCER)
80 V
Continuous Collector Current
1 A
Current Gain-Bandwidth Product (fT)
60 MHz
DC Current Gain (hFE)
20 x10³
DC Current Gain (hFE)
35 x10³
DC Current Gain (hFE)
20 x10³
DC Current Gain (hFE)
40 — 120 x10³
DC Current Gain (hFE)
25 x10³
DC Current Gain (hFE)
10 x10³
DC Current Gain (hFE)
10 x10³
ECCN Code
EAR99
Emitter-Base Breakdown Voltage (BVEBO)
7 V
Emitter-Base Cutoff Current (IEBO)
2 nA
Emitter-Base Voltage
7 V
HTS Code
8541.29.0065
Input Capacitance (Cib)
80 pF
Input Impedance Common Base (hib)
4 — 8 Ω
Input Impedance Common Base (hib)
24 — 34 Ω
Junction Temperature (Tj)
-65 — 200 °C
Noise Figure (NF)
6 dB
Output Admittance Common Base (hob)
0.08 — 1 µS
Output Admittance Common Base (hob)
0.08 — 0.5 µS
Output Capacitance (Cob)
15 pF
Power Dissipation
5 W
Power Dissipation
1 W
Small Signal Current Gain (hfe)
35 — 150 x10³
Small Signal Current Gain (hfe)
30 — 100 x10³
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient
175 °C/W
Thermal Resistance Junction-Case
35 °C/W
Voltage Feedback Ratio Common Base (hrb)
0.3 x10⁻³
Voltage Feedback Ratio Common Base (hrb)
0.3 x10⁻³
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 65V,1A,1W Through-Hole Transistor-Small Signal (<=1A) NPN High Current | Box | 500 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| 2N2102.PDF | Device Datasheet |
| Material Composition:TO-39 | Material Composition |
| Package Detail Document:TO-39 | Package Detail Document |
| Product Reliability Data:TO-39 Package Reliability | Product Reliability Data |