2N3763
60V,1.5A,1W Through-Hole Transistor-Bipolar Power (>1A) PNP General Purpose Amplifier/Switch
Specifications
Base Cutoff Current (IBL)
200 nA
Base-Emitter Saturation Voltage (VBE(SAT))
0.8 V
Base-Emitter Saturation Voltage (VBE(SAT))
1 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.2 V
Base-Emitter Saturation Voltage (VBE(SAT))
0.9 — 1.4 V
Case Type
TO-39
Collector-Base Breakdown Voltage (BVCBO)
60 V
Collector-Base Voltage
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
60 V
Collector-Emitter Cutoff Current (ICEV)
0.1 µA
Collector-Emitter Cutoff Current (ICEV)
10 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
100 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
220 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
900 mV
Collector-Emitter Voltage (VCEO)
60 V
Continuous Collector Current
1.5 A
Current Gain-Bandwidth Product (fT)
150 MHz
DC Current Gain (hFE)
40 x10³
DC Current Gain (hFE)
35 x10³
DC Current Gain (hFE)
20 — 80 x10³
DC Current Gain (hFE)
20 x10³
DC Current Gain (hFE)
35 x10³
Delay Time (td)
8 ns
ECCN Code
EAR99
Emitter-Base Breakdown Voltage (BVEBO)
5 V
Emitter-Base Voltage
5 V
Fall Time (tf)
35 ns
HTS Code
8541.29.0065
Input Capacitance (Cib)
80 pF
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
15 pF
Power Dissipation
4 W
Power Dissipation
1 W
Rise Time (tr)
35 ns
Storage Temperature (Tstg)
-65 — 200 °C
Storage Time (ts)
80 ns
Thermal Resistance Junction-Ambient
175 °C/W
Thermal Resistance Junction-Case
44 °C/W
Total Control Charge (QT)
30 nC
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination | variant_ncnr |
|---|---|---|---|---|---|---|
| Discontinued | 60V,1.5A,1W Through-Hole Transistor-Bipolar Power (>1A) PNP General Purpose Amplifier/Switch | Box | 500 | TIN | No |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| LSSGP062.PDF | Device Datasheet |
| Material Composition:TO-39 | Material Composition |
| Package Detail Document:TO-39 | Package Detail Document |
| Product EOL Notice:CP767V-2N3467 | Product EOL Notice |
| Product Reliability Data:TO-39 Package Reliability | Product Reliability Data |