2N4137
20V,200mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN Saturated Switch
Specifications
Base-Emitter Saturation Voltage (VBE(SAT))
1.15 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.6 V
Base-Emitter Saturation Voltage (VBE(SAT))
0.74 — 1 V
Case Type
TO-18
Collector-Base Breakdown Voltage (BVCBO)
40 V
Collector-Base Cutoff Current (ICBO)
30000 nA
Collector-Base Voltage
40 V
Collector-Emitter Breakdown Voltage (BVCES)
40 V
Collector-Emitter Breakdown Voltage (BVCEO)
20 V
Collector-Emitter Cutoff Current (ICES)
0.4 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
180 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
250 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
200 mV
Collector-Emitter Voltage (VCEO)
20 V
Collector-Emitter Voltage (VCES)
40 V
Continuous Collector Current
200 mA
Current Gain-Bandwidth Product (fT)
500 MHz
DC Current Gain (hFE)
40 — 120 x10³
DC Current Gain (hFE)
30 x10³
DC Current Gain (hFE)
40 — 120 x10³
DC Current Gain (hFE)
20 x10³
DC Current Gain (hFE)
20 x10³
ECCN Code
EAR99
Emitter-Base Breakdown Voltage (BVEBO)
4.5 V
Emitter-Base Voltage
4.5 V
HTS Code
8541.21.0075
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
4 pF
Peak Collector Current
500 mA
Power Dissipation
1.2 W
Power Dissipation
360 mW
Storage Temperature (Tstg)
-65 — 200 °C
Storage Time (ts)
13 ns
Thermal Resistance Junction-Ambient
486 °C/W
Thermal Resistance Junction-Case
146 °C/W
Turn Off Time (toff)
12 ns
Turn On Time (ton)
12 ns
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Discontinued | 20V,200mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN Saturated Switch | Box | 2,000 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| 2N4137.PDF | Device Datasheet |
| Material Composition:TO-18 | Material Composition |
| Package Detail Document:TO-18 | Package Detail Document |
| Product EOL Notice:2N4137 | Product EOL Notice |
| Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |