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2N5462

1.8V,9V,10mA,310mW Through-Hole JFET P Channel

Specifications

Case Type
TO-92
Common Source Forward Transadmittance (yfs)
2 — 6 mS
Common Source Input Capacitance (Ciss)
7 pF
Common Source Reverse Transfer Capacitance (Crss)
2 pF
Continuous Gate Current
10 mA
Drain-Gate Voltage
40 V
ECCN Code
EAR99
Equivalent Input Noise Voltage (eN)
115 nV/√Hz
Gate Leakage Current (IGSS)
1000 nA
Gate Leakage Current (IGSS)
5 nA
Gate-Source Breakdown Voltage (BVGSS)
40 V
Gate-Source Cutoff Voltage (VGS(OFF))
1.8 — 9 V
Gate-Source Voltage (VGS)
1.5 — 6 V
HTS Code
8541.21.0095
Junction Temperature (Tj)
-65 — 150 °C
Noise Figure (NF)
2.5 dB
Output Admittance (yos)
75 µS
Power Dissipation
310 mW
Reverse Gate-Source Voltage
40 V
Saturation Drain Current (IDSS)
4000 — 16000 µA
Storage Temperature (Tstg)
-65 — 150 °C

Product Options

PartStatusDescriptionPackaging CodePackaging QtyTermination
Active1.8V,9V,10mA,310mW Through-Hole JFET P ChannelBox2,500PBFREE
Active1.8V,9V,10mA,310mW Through-Hole JFET P ChannelAmmo2,000PBFREE
Active1.8V,9V,10mA,310mW Through-Hole JFET P ChannelTape & Reel2,000PBFREE

Resources

ItemType
Analytical Test Report:Copper Bonding WireAnalytical Test Report
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Analytical Test Report:Halogen FreeAnalytical Test Report
Analytical Test Report:Lead FrameAnalytical Test Report
Analytical Test Report:Pure Tin Solder, SnAnalytical Test Report
Analytical Test Report:Tin PlatingAnalytical Test Report
2N5460-5462.PDFDevice Datasheet
Material Composition:TO-92Material Composition
Package Detail Document:TO-92Package Detail Document
Process Change Notice:P-CHANNEL JFETSProcess Change Notice
Product Reliability Data:TO-92 Package ReliabilityProduct Reliability Data

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