2N6040
8A,60V Through-Hole Transistor-Bipolar Power (>1A) PNP Darlington
Specifications
Base-Emitter On Voltage (VBE(ON))
2.8 V
Base-Emitter Saturation Voltage (VBE(SAT))
4.5 V
Case Type
TO-220
Collector-Base Cutoff Current (ICBO)
20000 nA
Collector-Base Voltage
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
60 V
Collector-Emitter Cutoff Current (ICEO)
20 µA
Collector-Emitter Cutoff Current (ICEV)
20 µA
Collector-Emitter Cutoff Current (ICEV)
200 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
4000 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
2000 mV
Collector-Emitter Voltage (VCEO)
60 V
Continuous Base Current
120 mA
Continuous Collector Current
8 A
Current Gain-Bandwidth Product (fT)
4 MHz
DC Current Gain (hFE)
100 x10³
DC Current Gain (hFE)
1 — 20 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
2000000 nA
Emitter-Base Voltage
5 V
HTS Code
8541.29.0055
Junction Temperature (Tj)
-65 — 150 °C
Output Capacitance (Cob)
300 pF
Peak Collector Current
16 A
Power Dissipation
75 W
Small Signal Current Gain (hfe)
300 x10³
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Case
1.67 °C/W
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Discontinued | 8A,60V Through-Hole Transistor-Bipolar Power (>1A) PNP Darlington | Sleeve | 50 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| 2N6040-6045.PDF | Device Datasheet |
| Material Composition:TO-220 | Material Composition |
| Package Detail Document:TO-220 | Package Detail Document |
| Product EOL Notice:Power transistors bare die and | Product EOL Notice |
| Product Reliability Data:TO-220 Package Reliability | Product Reliability Data |