2N720A
80V,500mA,500mW Through-Hole Transistor-Small Signal (<=1A) NPN General Purpose Amplifier/Switch
Specifications
Base-Emitter Saturation Voltage (VBE(SAT))
1.3 V
Base-Emitter Saturation Voltage (VBE(SAT))
0.9 V
Case Type
TO-18
Collector-Base Breakdown Voltage (BVCBO)
120 V
Collector-Base Cutoff Current (ICBO)
15000 nA
Collector-Base Cutoff Current (ICBO)
10 nA
Collector-Base Voltage
120 V
Collector-Emitter Breakdown Voltage (BVCER)
100 V
Collector-Emitter Breakdown Voltage (BVCEO)
80 V
Collector-Emitter Saturation Voltage (VCE(SAT))
5000 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1200 mV
Collector-Emitter Voltage (VCEO)
80 V
Collector-Emitter Voltage (VCER)
100 V
Continuous Collector Current
500 mA
Current Gain-Bandwidth Product (fT)
50 MHz
DC Current Gain (hFE)
35 x10³
DC Current Gain (hFE)
20 x10³
DC Current Gain (hFE)
40 — 120 x10³
DC Current Gain (hFE)
20 x10³
ECCN Code
EAR99
Emitter-Base Breakdown Voltage (BVEBO)
7 V
Emitter-Base Cutoff Current (IEBO)
10 nA
Emitter-Base Voltage
7 V
HTS Code
8541.21.0095
Input Capacitance (Cib)
85 pF
Input Impedance Common Base (hib)
4 — 8 Ω
Input Impedance Common Base (hib)
20 — 30 Ω
Junction Temperature (Tj)
-65 — 200 °C
Output Admittance Common Base (hob)
0.5 µS
Output Admittance Common Base (hob)
0.5 µS
Output Capacitance (Cob)
15 pF
Power Dissipation
1 W
Power Dissipation
1.8 W
Power Dissipation
500 mW
Small Signal Current Gain (hfe)
45 x10³
Small Signal Current Gain (hfe)
30 — 100 x10³
Storage Temperature (Tstg)
-65 — 200 °C
Voltage Feedback Ratio Common Base (hrb)
0.15 x10⁻³
Voltage Feedback Ratio Common Base (hrb)
0.125 x10⁻³
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 80V,500mA,500mW Through-Hole Transistor-Small Signal (<=1A) NPN General Purpose Amplifier/Switch | Box | 2,000 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| LSSGP054.PDF | Device Datasheet |
| Material Composition:TO-18 | Material Composition |
| Package Detail Document:TO-18 | Package Detail Document |
| Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |