BC140-16
40V,1A,800mW Through-Hole Transistor-Small Signal (<=1A) NPN High Current
Specifications
Base-Emitter On Voltage (VBE(ON))
1.8 V
Case Type
TO-39
Collector-Base Cutoff Current (ICBO)
100000 nA
Collector-Base Cutoff Current (ICBO)
100 nA
Collector-Base Voltage
80 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1000 mV
Collector-Emitter Voltage (VCEO)
40 V
Continuous Collector Current
1 A
Current Gain-Bandwidth Product (fT)
50 MHz
DC Current Gain (hFE)
100 — 250 x10³(195 x10³ Typical)
DC Current Gain (hFE)
15 x10³
DC Current Gain (hFE)
100 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
100 nA
Emitter-Base Voltage
7 V
HTS Code
8541.21.0095
Input Capacitance (Cib)
80 pF
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
25 pF
Peak Base Current
200 mA
Peak Collector Current
1.5 A
Power Dissipation
3.7 W
Power Dissipation
800 mW
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient
219 °C/W
Thermal Resistance Junction-Case
42 °C/W
Turn Off Time (toff)
850 ns
Turn On Time (ton)
250 ns
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 40V,1A,800mW Through-Hole Transistor-Small Signal (<=1A) NPN High Current | Box | 500 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| BC140.PDF | Device Datasheet |
| Material Composition:TO-39 | Material Composition |
| Package Detail Document:TO-39 | Package Detail Document |
| Product Reliability Data:TO-39 Package Reliability | Product Reliability Data |