No image available
BCX38A
800mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington
Specifications
Base-Emitter On Voltage (VBE(ON))
1.8 V
Case Type
TO-92
Collector-Base Breakdown Voltage (BVCBO)
80 V
Collector-Base Cutoff Current (ICBO)
100 nA
Collector-Base Voltage
80 V
Collector-Emitter Breakdown Voltage (BVCEO)
60 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1250 mV
Collector-Emitter Voltage (VCEO)
60 V
Continuous Collector Current
800 mA
DC Current Gain (hFE)
1000 x10³
DC Current Gain (hFE)
500 x10³
ECCN Code
EAR99
Emitter-Base Breakdown Voltage (BVEBO)
10 V
Emitter-Base Cutoff Current (IEBO)
100 nA
Emitter-Base Voltage
10 V
HTS Code
8541.29.0055
Junction Temperature (Tj)
-65 — 150 °C
Peak Collector Current
2 A
Power Dissipation
1 W
Storage Temperature (Tstg)
-65 — 150 °C
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination | variant_ncnr |
|---|---|---|---|---|---|---|
| Active | 800mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | Box | 2,500 | LEAD or TIN | No | |
| Active | 800mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | Ammo | 2,000 | LEAD or TIN | No | |
| Active | 800mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | Ammo | 2,000 | LEAD or TIN | No | |
| Active | 800mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | Tape & Reel | 2,000 | LEAD or TIN | No | |
| Active | 800mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | Tape & Reel | 2,000 | LEAD or TIN | No |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Copper Wire | Analytical Test Report |
| Analytical Test Report:Epoxy Adhesive | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Halogen Free | Analytical Test Report |
| Analytical Test Report:Lead Frame | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder, Sn | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| LSSGP074.PDF | Device Datasheet |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Process Change Notice:CP327V replacing CP307V | Process Change Notice |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |