BD678
4A,60V Through-Hole Transistor-Bipolar Power (>1A) PNP Darlington
Specifications
Base-Emitter On Voltage (VBE(ON))
2.5 V
Case Type
TO-126
Collector-Base Cutoff Current (ICBO)
200000 nA
Collector-Base Cutoff Current (ICBO)
2000000 nA
Collector-Base Voltage
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
60 V
Collector-Emitter Cutoff Current (ICEO)
500 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
2500 mV
Collector-Emitter Voltage (VCEO)
60 V
Continuous Base Current
100 mA
Continuous Collector Current
4 A
DC Current Gain (hFE)
750 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
5000000 nA
Emitter-Base Voltage
5 V
HTS Code
8541.29.0055
Junction Temperature (Tj)
-65 — 150 °C
Peak Collector Current
6 A
Power Dissipation
40 W
Second Breakdown Collector Current (Is/b)
0.8 A
Small Signal Current Gain (hfe)
10 x10³
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient
100 °C/W
Thermal Resistance Junction-Case
3.12 °C/W
Turn Off Time (toff)
5000 ns
Turn On Time (ton)
1500 ns
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Discontinued | 4A,60V Through-Hole Transistor-Bipolar Power (>1A) PNP Darlington | Sleeve | 50 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| BD676_SERIES.PDF | Device Datasheet |
| Material Composition:TO-126 | Material Composition |
| Package Detail Document:TO-126 | Package Detail Document |
| Product EOL Notice:Power transistors bare die and | Product EOL Notice |
| Product Reliability Data:TO-126 Package Reliability | Product Reliability Data |