CMBDM3590
160mA,20V Surface mount MOSFET N-Channel Enhancement Mode
Specifications
Case Type
SOT-923
Common Source Input Capacitance (Ciss)
9 pF
Common Source Output Capacitance (Coss)
3 pF
Common Source Reverse Transfer Capacitance (Crss)
2.2 pF
Continuous Drain Current
200 mA
Continuous Drain Current
160 mA
Drain-Source Breakdown Voltage (BVDSS)
20 V
Drain-Source Voltage
20 V
ECCN Code
EAR99
Forward Transconductance (gFS)
1300 mS
Gate Leakage Current, Forward (IGSSF)
100 nA
Gate Leakage Current, Reverse (IGSSR)
100 nA
Gate Threshold Voltage (VGS(th))
0.4 — 1 V
Gate-Source Voltage (VGS)
8 V
HTS Code
8541.21.0095
Junction Temperature (Tj)
-65 — 150 °C
Power Dissipation
125 mW
Saturation Drain Current (IDSS)
0.1 µA
Saturation Drain Current (IDSS)
0.05 µA
Static Drain-Source On Resistance (rDS(ON))
10 Ω
Static Drain-Source On Resistance (rDS(ON))
6 Ω
Static Drain-Source On Resistance (rDS(ON))
4 Ω
Static Drain-Source On Resistance (rDS(ON))
3 Ω
Static Drain-Source On Resistance (rDS(ON))
7 Ω
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient
1000 °C/W
Turn Off Time (toff)
150 ns
Turn On Time (ton)
40 ns
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Discontinued, Stock Only | 160mA,20V Surface mount MOSFET N-Channel Enhancement Mode | Box | 5,000 | PBFREE | |
| Discontinued, Stock Only | 160mA,20V Surface mount MOSFET N-Channel Enhancement Mode | Tape & Reel | 8,000 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Halogen Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| CMBDM3590_7590.PDF | Device Datasheet |
| Material Composition:SOT-923 | Material Composition |
| Package Detail Document:SOT-923 | Package Detail Document |
| Product Reliability Data:SOT-923 Package Reliability | Product Reliability Data |