CP226V-2N4393
.5V,3V,50mA,1.8W Bare die,20.000 X 17.000 mils,JFET
Specifications
Case Type
CHIP,WAFFLE
Common Source Input Capacitance (Ciss)
14 pF
Common Source Reverse Transfer Capacitance (Crss)
4 pF
Continuous Gate Current
50 mA
Drain Current-Off (ID(OFF))
200000 pA
Drain Current-Off (ID(OFF))
100 pA
Drain-Gate Voltage
40 V
Drain-Source On Resistance (rds(ON))
100 Ω
Drain-Source On Voltage (VDS(ON))
400 mV
ECCN Code
EAR99
Fall Time (tf)
30 ns
Gate Leakage Current (IGSS)
200 nA
Gate Leakage Current (IGSS)
0.1 nA
Gate-Source Breakdown Voltage (BVGSS)
40 V
Gate-Source Cutoff Voltage (VGS(OFF))
0.5 — 3 V
Gate-Source Forward Voltage (VGS(f))
1 V
Gate-Source Voltage (VGS)
40 V
HTS Code
8541.29.0040
Junction Temperature (Tj)
-65 — 175 °C
Power Dissipation
1.8 W
Rise Time (tr)
5 ns
Saturation Drain Current (IDSS)
5000 — 30000 µA
Static Drain-Source On Resistance (rDS(ON))
100 Ω
Storage Temperature (Tstg)
-65 — 175 °C
Turn-off Delay Time (tOFF)
50 ns
Turn-on Delay Time (tON)
15 ns
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | .5V,3V,50mA,1.8W Bare die,20.000 X 17.000 mils,JFET | WafflePack | 400 | PBFREE | |
| Active | .5V,3V,50mA,1.8W Bare die,20.000 X 17.000 mils,JFET | WafflePack | 400 | PBFREE | |
| Special Order Item | .5V,3V,50mA,1.8W Bare die,20.000 X 17.000 mils,JFET | WafflePack | 20 | PBFREE | |
| Active | .5V,3V,50mA,1.8W Up-Screened Bare Die MIL-PRF-38534 Class K Equivalent,20.000 X 17.000 mils,JFET | WafflePack | 400 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CP226V-2N4393_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |