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CP230-2N6039
4A,80V Up-Screened Bare Die MIL-PRF-38534 Class H Equivalent,80.000 X 80.000 mils,Transistor-Bipolar Power (>1A)
Specifications
Base-Emitter On Voltage (VBE(ON))
2.8 V
Base-Emitter Saturation Voltage (VBE(SAT))
4 V
Case Type
CHIP,WAFFLE
Collector-Base Cutoff Current (ICBO)
500000 nA
Collector-Base Voltage
80 V
Collector-Emitter Breakdown Voltage (BVCEO)
80 V
Collector-Emitter Cutoff Current (ICEO)
100 µA
Collector-Emitter Cutoff Current (ICEV)
100 µA
Collector-Emitter Cutoff Current (ICEV)
500 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
3000 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
2000 mV
Collector-Emitter Voltage (VCEO)
80 V
Continuous Base Current
100 mA
Continuous Collector Current
4 A
Current Gain-Bandwidth Product (fT)
25 MHz
DC Current Gain (hFE)
0.75 — 15 x10³
DC Current Gain (hFE)
100 x10³
DC Current Gain (hFE)
500 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
2000000 nA
Emitter-Base Voltage
5 V
HTS Code
8541.29.0040
Junction Temperature (Tj)
-65 — 150 °C
Output Capacitance (Cob)
100 pF
Peak Collector Current
8 A
Power Dissipation
40 W
Power Dissipation
1.5 W
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient
83.3 °C/W
Thermal Resistance Junction-Case
3.12 °C/W
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Discontinued | 4A,80V Up-Screened Bare Die MIL-PRF-38534 Class H Equivalent,80.000 X 80.000 mils,Transistor-Bipolar Power (>1A) | WafflePack | 100 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CP230-2N6039_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CP230/630 -> CP260/660 | Process Change Notice |
| Product EOL Notice:CP230 / CP630 | Product EOL Notice |