CPD65-BAV45
50mA,35V Bare die,11.800 X 11.800 mils,Diode-Switching
Specifications
Average Forward Current
50 mA
Case Type
CHIP,WAFFLE
Continuous Forward Current
50 mA
Continuous Reverse Voltage
20 V
ECCN Code
EAR99
Forward Voltage (VF)
1 V
HTS Code
8541.10.0040
Junction Capacitance (CJ)
1.3 pF
Junction Temperature (Tj)
-65 — 125 °C
Peak Repetitive Forward Current
100 mA
Peak Repetitive Reverse Voltage
35 V
Reverse Recovery Time (trr)
600 ns
Reverse Voltage Leakage Current (IR)
0.00025 µA
Reverse Voltage Leakage Current (IR)
0.00001 µA
Reverse Voltage Leakage Current (IR)
0.000005 µA
Storage Temperature (Tstg)
-65 — 125 °C
Thermal Resistance Junction-Ambient
500 °C/W
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Discontinued | 50mA,35V Bare die,11.800 X 11.800 mils,Diode-Switching | WafflePack | 400 | PBFREE | |
| Discontinued | 50mA,35V Bare die,11.800 X 11.800 mils,Diode-Switching | WafflePack | 400 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CPD65-BAV45_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CPD65-BAV45 | Product EOL Notice |
| Spice Model:Spice Model CPD65 | Spice Model |