CPD66X-1N3595
Bare die,17.500 X 17.500 mils,Diode-Switching,Low Leakage Switching Diode
Specifications
Average Forward Current
150 mA
Case Type
CHIP,WAFFLE
Continuous Forward Current
225 mA
Continuous Reverse Voltage
125 V
Device Family
Diodes and Rectifiers
ECCN Code
EAR99
Forward Voltage (VF)
0.54 — 0.69 V
Forward Voltage (VF)
0.62 — 0.77 V
Forward Voltage (VF)
0.65 — 0.8 V
Forward Voltage (VF)
0.75 — 0.88 V
Forward Voltage (VF)
0.79 — 0.92 V
Forward Voltage (VF)
0.83 — 1 V
HTS Code
8541.10.0040
Junction Capacitance (CJ)
8 pF
Junction Temperature (Tj)
-65 — 200 °C
Peak Forward Surge Current
500 mA
Peak Forward Surge Current
4 A
Peak Repetitive Forward Current
600 mA
Peak Repetitive Reverse Voltage
150 V
Power Dissipation
500 mW
Reverse Breakdown Voltage (BVR)
150 V
Reverse Recovery Time (trr)
3000 ns
Reverse Voltage Leakage Current (IR)
0.3 µA
Reverse Voltage Leakage Current (IR)
0.001 µA
Reverse Voltage Leakage Current (IR)
0.5 µA
Reverse Voltage Leakage Current (IR)
3 µA
Storage Temperature (Tstg)
-65 — 200 °C
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | Bare die,17.500 X 17.500 mils,Diode-Switching,Low Leakage Switching Diode | WafflePack | 400 | PBFREE | |
| Active | Bare die,17.500 X 17.500 mils,Diode-Switching,Low Leakage Switching Diode | WafflePack | 400 | PBFREE | |
| Special Order Item | Bare die,17.500 X 17.500 mils,Diode-Switching,Low Leakage Switching Diode | WafflePack | 20 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CPD66X-1N3595_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CPD66X DOPANT CHANGE | Process Change Notice |
| Spice Model:Spice Model CPD66 | Spice Model |