CPD66X-1N3595
Bare die,17.500 X 17.500 mils,Diode-Switching,Low Leakage Switching Diode
Specifications
Average Forward Current
150 mA
Case Type
CHIP,WAFFLE
Continuous Forward Current
225 mA
Continuous Reverse Voltage
125 V
ECCN Code
EAR99
Forward Voltage (VF)
0.62 — 0.77 V
Forward Voltage (VF)
0.65 — 0.8 V
Forward Voltage (VF)
0.75 — 0.88 V
Forward Voltage (VF)
0.79 — 0.92 V
Forward Voltage (VF)
0.83 — 1 V
Forward Voltage (VF)
0.54 — 0.69 V
HTS Code
8541.10.0040
Junction Capacitance (CJ)
8 pF
Junction Temperature (Tj)
-65 — 200 °C
Peak Forward Surge Current
4 A
Peak Forward Surge Current
500 mA
Peak Repetitive Forward Current
600 mA
Peak Repetitive Reverse Voltage
150 V
Power Dissipation
500 mW
Reverse Breakdown Voltage (BVR)
150 V
Reverse Recovery Time (trr)
3000 ns
Reverse Voltage Leakage Current (IR)
0.001 µA
Reverse Voltage Leakage Current (IR)
0.5 µA
Reverse Voltage Leakage Current (IR)
3 µA
Reverse Voltage Leakage Current (IR)
0.3 µA
Storage Temperature (Tstg)
-65 — 200 °C
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | Bare die,17.500 X 17.500 mils,Diode-Switching,Low Leakage Switching Diode | WafflePack | 400 | PBFREE | |
| Active | Bare die,17.500 X 17.500 mils,Diode-Switching,Low Leakage Switching Diode | WafflePack | 400 | PBFREE | |
| Special Order Item | Bare die,17.500 X 17.500 mils,Diode-Switching,Low Leakage Switching Diode | WafflePack | 20 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CPD66X-1N3595_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CPD66X DOPANT CHANGE | Process Change Notice |
| Spice Model:Spice Model CPD66 | Spice Model |