CPD76X-CMLSH1-40
40V Bare die,32.300 X 32.300 mils,Rectifier-Schottky (>=1A)
Specifications
Case Type
CHIP,WAFFLE
Continuous Forward Current
1 A
ECCN Code
EAR99
Forward Voltage (VF)
0.29 V
Forward Voltage (VF)
0.36 V
Forward Voltage (VF)
0.45 V
Forward Voltage (VF)
0.55 V
HTS Code
8541.10.0040
Junction Capacitance (CJ)
50 pF
Junction Temperature (Tj)
-65 — 150 °C
Peak Forward Surge Current
10 A
Peak Repetitive Forward Current
3.5 A
Peak Repetitive Reverse Voltage
40 V
Power Dissipation
250 mW
Reverse Breakdown Voltage (BVR)
40 V
Reverse Recovery Time (trr)
15 ns
Reverse Voltage Leakage Current (IR)
20 µA
Reverse Voltage Leakage Current (IR)
50 µA
Reverse Voltage Leakage Current (IR)
10 µA
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient
500 °C/W
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 40V Bare die,32.300 X 32.300 mils,Rectifier-Schottky (>=1A) | WafflePack | 400 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CPD76X-CMLSH1-40_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |