CPL03-CMJD2700
100V,2.69mA Bare die,15.700 X 15.700 mils,Diode-Current Limiting
Specifications
Case Type
CHIP,WAFFLE
Dynamic Impedance (ZT)
0.3 MΩ
ECCN Code
EAR99
HTS Code
8541.10.0040
Junction Temperature (Tj)
-65 — 150 °C
Knee Impedance (ZK)
30 kΩ
Limiting Voltage (VL)
2.7 V
Peak Operating Voltage
100 V
Power Dissipation
780 mW
Power Dissipation
445 mW
Regulator Current (IP)
2.28 — 3.1 mA(2.69 mA Typical)
Storage Temperature (Tstg)
-65 — 150 °C
Temperature Coefficient (TC)
-0.45 — -0.18 %/°C
Thermal Resistance Junction-Ambient
160 °C/W
Thermal Resistance Junction-Ambient
280 °C/W
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 100V,2.69mA Bare die,15.700 X 15.700 mils,Diode-Current Limiting | WafflePack | 400 | PBFREE | |
| Active | 100V,2.69mA Bare die,15.700 X 15.700 mils,Diode-Current Limiting | WafflePack | 400 | PBFREE | |
| Special Order Item | 100V,2.69mA Bare die,15.700 X 15.700 mils,Diode-Current Limiting | WafflePack | 20 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CPL03-CMJD0130_SERIES_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product Brief:PB CPL03-CMJD SER | Product Brief |