CPZ48X-CMPZ4117
25V,350mW Bare die,13.000 X 13.000 mils,Diode-Zener
Specifications
Case Type
CHIP,WAFFLE
ECCN Code
EAR99
Forward Voltage (VF)
1 V
HTS Code
8541.10.0040
Junction Temperature (Tj)
-65 — 150 °C
Maximum Zener Current
9.5 mA
Noise Density (ND)
40 uV/√Hz
Power Dissipation
350 mW
Reverse Voltage Leakage Current (IR)
0.01 µA
Storage Temperature (Tstg)
-65 — 150 °C
Zener Impedance (ZZT)
150 Ω
Zener Voltage (VZ)
23.75 — 26.25 V(25 V Typical)
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 25V,350mW Bare die,13.000 X 13.000 mils,Diode-Zener | WafflePack | 400 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CPZ48X-CMPZ4099-4124_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |