CPZ58X-1N4617
2.4V,250mW Bare die,12.990 X 12.990 mils,Diode-Zener
Specifications
Case Type
CHIP,WAFFLE
Device Family
Diodes and Rectifiers
ECCN Code
EAR99
Forward Voltage (VF)
1 V
HTS Code
8541.10.0040
Junction Temperature (Tj)
-65 — 200 °C
Maximum Zener Current
95 mA
Noise Density (ND)
1 uV/√Hz
Power Dissipation
250 mW
Reverse Voltage Leakage Current (IR)
2 µA
Storage Temperature (Tstg)
-65 — 200 °C
Zener Impedance (ZZT)
1400 Ω
Zener Voltage (VZ)
2.28 — 2.52 V(2.4 V Typical)
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 2.4V,250mW Bare die,12.990 X 12.990 mils,Diode-Zener | WafflePack | 400 | PBFREE | |
| Active | 2.4V,250mW Bare die,12.990 X 12.990 mils,Diode-Zener | WafflePack | 400 | PBFREE | |
| Active | 2.4V,250mW Bare die,12.990 X 12.990 mils,Diode-Zener | Wafer | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Package Detail Document:WAFER | Package Detail Document |