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MPS8097
40V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise
Specifications
Base-Emitter On Voltage (VBE(ON))
0.45 — 0.65 V
Case Type
TO-92
Collector-Base Cutoff Current (ICBO)
10000 nA
Collector-Base Cutoff Current (ICBO)
30 nA
Collector-Base Voltage
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
40 V
Collector-Emitter Voltage (VCEO)
40 V
Continuous Collector Current
200 mA
DC Current Gain (hFE)
250 — 700 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
20 nA
Emitter-Base Voltage
6 V
Equivalent Input Noise Voltage (eN)
32 nV/√Hz
HTS Code
8541.21.0095
Input Capacitance (Cib)
10 pF
Junction Temperature (Tj)
-65 — 150 °C
Noise Figure (NF)
2 dB
Output Capacitance (Cob)
1 — 4 pF
Power Dissipation
625 mW
Small Signal Current Gain (hfe)
250 — 800 x10³
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient
200 °C/W
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination | variant_ncnr |
|---|---|---|---|---|---|---|
| Active | 40V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | Box | 2,500 | LEAD or TIN | No | |
| Active | 40V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | Ammo | 2,000 | LEAD or TIN | No | |
| Active | 40V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | Ammo | 2,000 | LEAD or TIN | No | |
| Active | 40V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | Tape & Reel | 2,000 | LEAD or TIN | No | |
| Active | 40V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | Tape & Reel | 2,000 | LEAD or TIN | No |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Copper Wire | Analytical Test Report |
| Analytical Test Report:Epoxy Adhesive | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Halogen Free | Analytical Test Report |
| Analytical Test Report:Lead Frame | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder, Sn | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| MPS8097.PDF | Device Datasheet |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |