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AEM

Up-screened bare die for mission-critical applications

We bridge the gap between commercial availability and mission-critical reliability to ensure every die meets the stringent demands of space and defense. By utilizing semiconductor chips in their bare die form, we gain unrivaled control over thermal management, electrical integrity, and device configuration.

Our up-screened products

  • MOSFETS and JFETS
  • Transistors

Engineering excellence — from COTS to Class K

We specialize in elevating Commercial Off-The-Shelf (COTS) bare die solutions to meet or exceed the highest industry standards.

Whether your project requires standard military flows or custom parameters, we provide the screening necessary to guarantee performance.

  • MIL-PRF-38534: Screening to Class H and Class K equivalents.
  • MIL-PRF-19500: Screening to Class HC and Class KC equivalents.
  • Custom SCDs: Testing performed to your specific Source Control Drawings.

The AEM Advantage: Quality without compromise

Our advantage

The outcome for your design

100% Wafter Probe

Every die is electrically tested; all rejects are inked to ensure only known-good-die (KGD) reach your assembly.

Class 1000 Clean Room

All probing and sensitive handling are performed in a strictly controlled environment to prevent contamination.

MIL-STD-750 Inspection

Visual inspection is conducted in accordance with Method 2073, ensuring physical perfection before shipment.

US-Based Inventory

Specialized testing is performed in-house at our Hauppauge, NY facility, significantly reducing logistics-based lead times.

On-Site Up-Screening

The majority of our die inventory is staged in the United States, ensuring supply chain security and rapid fulfillment.

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Up-screened bare die part number nomenclature