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CP101-BSS52
1A Bare die,27.500 X 27.500 mils,Transistor-Small Signal (<=1A)
Specifications
Base-Emitter On Voltage (VBE(ON))
1.4 — 1.75 V
Base-Emitter On Voltage (VBE(ON))
1.3 — 1.65 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.9 V
Base-Emitter Saturation Voltage (VBE(SAT))
2.2 V
Case Type
CHIP,WAFFLE
Collector-Base Cutoff Current (ICBO)
50 nA
Collector-Base Voltage
90 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1600 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1300 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1300 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1600 mV
Collector-Emitter Voltage (VCER)
80 V
Continuous Collector Current
1 A
DC Current Gain (hFE)
2000 x10³
DC Current Gain (hFE)
1000 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
50 nA
Emitter-Base Voltage
5 V
HTS Code
8541.21.0040
Junction Temperature (Tj)
-65 — 200 °C
Peak Base Current
100 mA
Peak Collector Current
2 A
Power Dissipation
5 W
Power Dissipation
800 mW
Small Signal Current Gain (hfe)
10 x10³
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient
219 °C/W
Thermal Resistance Junction-Case
35 °C/W
Turn Off Time (toff)
1500 ns
Turn Off Time (toff)
1500 ns
Turn On Time (ton)
400 ns
Turn On Time (ton)
400 ns
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Discontinued | 1A Bare die,27.500 X 27.500 mils,Transistor-Small Signal (<=1A) | WafflePack | 400 | PBFREE | |
| Discontinued | 1A Bare die,27.500 X 27.500 mils,Transistor-Small Signal (<=1A) | WafflePack | 20 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CP101-BSS52_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CP101 wafer process | Product EOL Notice |