CP219-2N5339
100V,5A,6W Bare die,82.690 X 82.690 mils,Transistor-Bipolar Power (>1A)
Specifications
Base-Emitter Saturation Voltage (VBE(SAT))
1.8 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.2 V
Case Type
CHIP,WAFFLE
Collector-Base Cutoff Current (ICBO)
10000 nA
Collector-Base Voltage
100 V
Collector-Emitter Breakdown Voltage (BVCEO)
100 V
Collector-Emitter Cutoff Current (ICEO)
100 µA
Collector-Emitter Cutoff Current (ICEV)
10 µA
Collector-Emitter Cutoff Current (ICEV)
1000 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
1200 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
700 mV
Collector-Emitter Voltage (VCEO)
100 V
Continuous Base Current
1 A
Continuous Collector Current
5 A
Current Gain-Bandwidth Product (fT)
30 MHz
DC Current Gain (hFE)
60 — 240 x10³
DC Current Gain (hFE)
40 x10³
DC Current Gain (hFE)
60 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
100000 nA
Emitter-Base Voltage
6 V
Fall Time (tf)
200 ns
HTS Code
8541.29.0040
Input Capacitance (Cib)
1000 pF
Input Capacitance (Cib)
1000 pF
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
250 pF
Power Dissipation
6 W
Storage Temperature (Tstg)
-65 — 200 °C
Storage Time (ts)
2000 ns
Thermal Resistance Junction-Case
29 °C/W
Turn On Time (ton)
200 ns
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Discontinued | 100V,5A,6W Bare die,82.690 X 82.690 mils,Transistor-Bipolar Power (>1A) | WafflePack | 100 | PBFREE | |
| Discontinued | 100V,5A,6W Bare die,82.690 X 82.690 mils,Transistor-Bipolar Power (>1A) | WafflePack | 100 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CP219-2N5339_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CP219 DIE PROCESS | Product EOL Notice |