CP318V-2N5682
120V,1A,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A)
Specifications
Base-Emitter On Voltage (VBE(ON))
1 V
Case Type
CHIP,WAFFLE
Collector-Base Cutoff Current (ICBO)
1000 nA
Collector-Base Voltage
120 V
Collector-Emitter Breakdown Voltage (BVCEO)
120 V
Collector-Emitter Cutoff Current (ICEO)
10 µA
Collector-Emitter Cutoff Current (ICEV)
1 µA
Collector-Emitter Cutoff Current (ICEV)
1000 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
600 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1000 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
2000 mV
Collector-Emitter Voltage (VCEO)
120 V
Continuous Base Current
500 mA
Continuous Collector Current
1 A
Current Gain-Bandwidth Product (fT)
30 MHz
DC Current Gain (hFE)
5 x10³
DC Current Gain (hFE)
40 — 150 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
1000 nA
Emitter-Base Voltage
4 V
HTS Code
8541.29.0040
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
50 pF
Power Dissipation
10 W
Power Dissipation
1 W
Small Signal Current Gain (hfe)
40 x10³
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient
175 °C/W
Thermal Resistance Junction-Case
17.5 °C/W
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 120V,1A,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A) | WafflePack | 400 | PBFREE | |
| Special Order Item | 120V,1A,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A) | WafflePack | 20 | PBFREE | |
| Active | 120V,1A,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A) | WafflePack | 400 | PBFREE | |
| Special Order Item | 120V,1A,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A) | WafflePack | 20 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CP318V-2N5682_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |