CP327V-CMLT6427E
500mA,40V Bare die,22.835 X 22.835 mils,Transistor-Small Signal (<=1A)
Specifications
Base-Emitter On Voltage (VBE(ON))
1.75 V
Base-Emitter Saturation Voltage (VBE(SAT))
2 V
Case Type
CHIP,WAFFLE
Collector-Base Breakdown Voltage (BVCBO)
60 V
Collector-Base Cutoff Current (ICBO)
100 nA
Collector-Base Voltage
60 V
Collector-Emitter Breakdown Voltage (BVCES)
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
40 V
Collector-Emitter Cutoff Current (ICEO)
0.1 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
850 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1000 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
800 mV
Collector-Emitter Voltage (VCEO)
40 V
Collector-Emitter Voltage (VCES)
60 V
Continuous Collector Current
500 mA
Current Gain-Bandwidth Product (fT)
200 MHz
DC Current Gain (hFE)
25 — 200 x10³
DC Current Gain (hFE)
15 — 140 x10³
DC Current Gain (hFE)
15 — 100 x10³
ECCN Code
EAR99
Emitter-Base Breakdown Voltage (BVEBO)
14 V
Emitter-Base Cutoff Current (IEBO)
100 nA
Emitter-Base Voltage
14 V
HTS Code
8541.21.0040
Input Capacitance (Cib)
15 pF
Junction Temperature (Tj)
-65 — 150 °C
Noise Figure (NF)
10 dB
Output Capacitance (Cob)
7 pF
Power Dissipation
300 mW
Power Dissipation
150 mW
Power Dissipation
350 mW
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient
357 °C/W
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 500mA,40V Bare die,22.835 X 22.835 mils,Transistor-Small Signal (<=1A) | WafflePack | 400 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CP327V-CMLT6427E_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |