CP705V-2N4033
80V,1A,800mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)
Specifications
Base-Emitter On Voltage (VBE(ON))
1.1 V
Base-Emitter Saturation Voltage (VBE(SAT))
0.9 V
Case Type
CHIP,WAFFLE
Collector-Base Breakdown Voltage (BVCBO)
80 V
Collector-Base Cutoff Current (ICBO)
50000 nA
Collector-Base Cutoff Current (ICBO)
50 nA
Collector-Base Voltage
80 V
Collector-Emitter Breakdown Voltage (BVCEO)
80 V
Collector-Emitter Saturation Voltage (VCE(SAT))
150 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1000 mV
Collector-Emitter Voltage (VCEO)
80 V
Continuous Collector Current
1 A
Current Gain-Bandwidth Product (fT)
150 — 400 MHz
DC Current Gain (hFE)
100 — 300 x10³
DC Current Gain (hFE)
40 x10³
DC Current Gain (hFE)
70 x10³
DC Current Gain (hFE)
25 x10³
DC Current Gain (hFE)
75 x10³
ECCN Code
EAR99
Emitter-Base Cutoff Current (IEBO)
10000 nA
Emitter-Base Voltage
5 V
Fall Time (tf)
50 ns
HTS Code
8541.29.0040
Input Capacitance (Cib)
110 pF
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
20 pF
Power Dissipation
4 W
Power Dissipation
800 mW
Storage Temperature (Tstg)
-65 — 200 °C
Storage Time (ts)
350 ns
Turn On Time (ton)
100 ns
Product Options
| Part | Status | Description | Packaging Code | Packaging Qty | Termination |
|---|---|---|---|---|---|
| Active | 80V,1A,800mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) | WafflePack | 400 | PBFREE | |
| Active | 80V,1A,800mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) | WafflePack | 400 | PBFREE |
Resources
| Item | Type |
|---|---|
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| CP705V_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |