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CP705V-CZT4033

80V,1A,2W Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)

Specifications

Base-Emitter Saturation Voltage (VBE(SAT))
1.1 V
Base-Emitter Saturation Voltage (VBE(SAT))
0.9 V
Case Type
CHIP,WAFFLE
Collector-Base Breakdown Voltage (BVCBO)
80 V
Collector-Base Cutoff Current (ICBO)
50 nA
Collector-Base Voltage
80 V
Collector-Emitter Breakdown Voltage (BVCEO)
80 V
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
150 mV
Collector-Emitter Voltage (VCEO)
80 V
Continuous Collector Current
1 A
Current Gain-Bandwidth Product (fT)
100 MHz
DC Current Gain (hFE)
100 — 300 x10³
DC Current Gain (hFE)
70 x10³
DC Current Gain (hFE)
25 x10³
DC Current Gain (hFE)
75 x10³
ECCN Code
EAR99
Emitter-Base Breakdown Voltage (BVEBO)
5 V
Emitter-Base Cutoff Current (IEBO)
10 nA
Emitter-Base Voltage
5 V
HTS Code
8541.29.0040
Input Capacitance (Cib)
110 pF
Junction Temperature (Tj)
-65 — 150 °C
Output Capacitance (Cob)
20 pF
Peak Collector Current
1.5 A
Power Dissipation
2 W
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient
62.5 °C/W

Product Options

PartStatusDescriptionPackaging CodePackaging QtyTermination
Active80V,1A,2W Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)WafflePack400PBFREE
Active80V,1A,2W Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)WafflePack400PBFREE
Special Order Item80V,1A,2W Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)WafflePack20PBFREE
Active80V,1A,2W Up-Screened Bare Die MIL-PRF-38534 Class H Equivalent,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)WafflePack400PBFREE

Resources

ItemType
Analytical Test Report:Active Device, RectifierAnalytical Test Report
Analytical Test Report:DieAnalytical Test Report
Analytical Test Report:DieAnalytical Test Report
Analytical Test Report:Die AttachAnalytical Test Report
Analytical Test Report:Wafer SchottkyAnalytical Test Report
Analytical Test Report:Wafer SchottkyAnalytical Test Report
Analytical Test Report:Wafer Switching DiodeAnalytical Test Report
Analytical Test Report:Wafer TransistorAnalytical Test Report
Analytical Test Report:Wafer ZenerAnalytical Test Report
CP705V_WPD.PDFDevice Datasheet
Package Detail Document:WAFERPackage Detail Document

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