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AEM

Access SPICE models for AEM high-reliability ferrite chip beads and semiconductors to simulate and optimize your circuit designs. Download model files for use in LTspice, PSpice, and other simulation tools.

1395 documents found
DescriptionDownload
Analytical Test Report: Sn Plating (ATR00075)PDF5.2 MBDownload
Analytical Test Report: Sn Plating (ATR00092)PDF731.1 KBDownload
Analytical Test Report: Sn Plating (ATR00104)PDF475.5 KBDownload
Analytical Test Report: Sn Plating (ATR00190)PDF836.5 KBDownload
Analytical Test Report: Sn Plating (ATR00253)PDF223.4 KBDownload
Analytical Test Report: Solder (ATR00244)PDF1.4 MBDownload
Analytical Test Report: Terminal PlatingPDF756.5 KBDownload
Analytical Test Report: Tin Ingot (ATR00201)PDF1007.1 KBDownload
Analytical Test Report: Tin Plating (ATR00156)PDF505.7 KBDownload
Analytical Test Report: Tin Plating (ATR00185)PDF845.7 KBDownload
Analytical Test Report: UV Ink (ATR00242)PDF451.2 KBDownload
Analytical Test Report: Wire (ATR00220)PDF4.1 MBDownload
Analytical Test Report: Wire (ATR00227)PDF870.9 KBDownload
App Note on SMT DevicesApplication note regarding surface mount technology (SMT) devices.PDF319.1 KBDownload
Application Note - 100V GaN FETs for Solar Power ApplicationsPDF379.8 KBDownload
Application Note - 650V GaN FETs in a Totem-Pole PFCPDF769.3 KBDownload
Automotive-Grade High-Power SMD Fuse (QM2822H & QM2840H)New Product Introduction: AEM Components QM2822H & QM2840H series SMH fuses.PDF639.9 KBDownload
Bare Die - Darlington TransistorsPDF202.5 KBDownload
Bare Die - General Purpose TransistorsPDF340.9 KBDownload
Bare Die - Gross Die Per Wafer & Wafer SizePDF245.8 KBDownload
Bare Die - MOSFETs & JFETsPDF198.4 KBDownload
Bare Die - Online Product PortfolioPDF2.1 MBDownload
Bare Die - Part NumberingPDF595.0 KBDownload
Bare Die - Protection DevicesPDF150.8 KBDownload
Bare Die - Quality PolicyPDF495.4 KBDownload